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KMID : 0381920060360030209
Korean Journal of Microscopy
2006 Volume.36 No. 3 p.209 ~ p.216
Reliability Test of the TEM Rotation Holder for 3-D Structure Analysis
Kim Jin-Gyu

Jeong Jong-Man
Kim Young-Min
Kim Youn-Joong
Abstract
Accuracy and precision of the goniometer and the specimen holder should be measured and corrected to improve reliability of 3-D structure analysis using transmission electron microscopy (TEM). In this study, we described the operation principle and performance of the Gatan rotation holder. Through analysis of the images taken inside the microscope, rotation angles were measured within the accuracy of ¡¾0.42?. For comparison the rotation angles were measured outside the microscope using a home-made measurement tool, which resulted in the accuracy of ¡¾0.6?. Additionally, we found abnormal specimen drifts during rotation probably due to the unstable engagement between the specimen cup and the rotation belt.
KEYWORD
TEM, Rotation holder, Reliability, Rotation angle, 3-D structure analysis
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